Ultrathin "bed-of-nails" membranes of single-wall carbon nanotubes

Journal of the American Chemical Society

Volumn 126, Issue 31, 2004, Pages 9502-9503

  Wang, Yuhuang ^a   Da, Sean ^d   Kim, Myung Jong ^a   Kelly, Kevin F ^a,b,c   Guo, Wenhua ^a   Kittrell, Carter ^a   Hauge, Robert H ^a   Smalley, Richard E ^a,c  

^a RICE UNIVERSITY   (United States)

^b Rice University   (United States)

^c RICE UNIVERSITY   (United States)

^d Thermo Fisher Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; NANOPARTICLE;

ARTICLE; ELECTROCHEMICAL ANALYSIS; ELECTRON BEAM; MEMBRANE TRANSPORT; PHASE SEPARATION; SCANNING TUNNELING MICROSCOPY; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

EID: 3543123059     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja048680j     Document Type: Article

References (21)

1. Baughman, R. H.; Zakhidov, A. A.; de Heer, W. A. Science 2002, 297, 787.
2. For example: (a) Che, G.; Lakshmi, B. B.; Fisher, E. R.; Martin, C. R. Nature 1998, 393, 346.
3. (b) Joo, S. H.; Choi, S. J.; Oh, I.; Kwak, J.; Liu, Z.; Terasaki, O.; Ryoo, R. Nature 2001, 412, 169.
4. (c) Hinds, B. J.; Chopra, N.; Rantell, T.; Andrews, R.; Gavalas, V.; Bachas, L. Science 2004, 303, 62.
5. (a) Wang, Q.; Challa, S. R.; Sholl, D. S.; Johnson, J. K. Phys. Rev. Lett. 1999, 82, 956.
6. (b) Skoulidas A. I.; Ackerman, D. M.; Johnson, J. K.; Sholl, D. S. Phys. Rev. Lett. 2002, 89, 185901.
7. 4 dope through a 125-μm orifice. For details, see: Zhou, W.; Vavro, J.; Guthy, C.; Winey, K. I.; Fischer, J. E.; Ericson, L. M.; Ramesh, S.; Saini, R.; Davis, V. A.; Kittrell, C.; Pasquali, M.; Hauge, R. H.; Smalley, R. E. J. Appl. Phys. 2004, 95, 649.
8. (a) Cuberes, M. T.; Schlittler, R. R.; Gimzewski, J. K. Appl. Phys. Lett. 1996, 69, 3016.
9. (b) Lu, X.; Grobis, M.; Khoo, K. H.; Louie, S. G.; Crommie, M. F. Phys. Rev. Lett. 2003, 90, 096802/1.
10. (c) Kelly, K. F.; Mickelson, E. T.; Hauge, R. H.; Margrave, J. L.; Halas, N. J. Proc. Natl. Acad. Sci. U.S.A. 2000, 97, 10318.
11. (d) Schelz, S.; Richmond, T.; Kania, P.; Oelhafen, P.; Guentherodt, H. J. Surf. Sci. 1996, 359, 227.
12. (e) Burgler, D. E.; Schmidt, C. M.; Schaller, D. M.; Meisinger, F.; Schaub, T. M.; Baratoff, A.; Guntherodt, H. J. Phys. Rev. B 1999, 59, 10895.
13. For example: (a) Liu, J.; Rinzler, A. G.; Dai, H. J.; Hafner, J. H.; Bradley, R. K.; Boul, P. J.; Lu, A.; Iverson, T.; Shelimov, K.; Huffman, C. B.; Rodriguezmacias, F.; Shon, Y. S.; Lee, T. R.; Colbert, D. T.; Smalley, R. E. Science 1998, 280, 1253.
14. (b) Gu, Z.; Peng, H.; Hauge, R. H.; Smalley, R. E.; Margrave, J. L. Nano Lett. 2002, 2, 1009.
15. (c) Lustig, S. R.; Boyes, E. D.; French, R. H.; Gierke, T. D.; Harmer, M. A.; Hietpas, P. B.; Jagota, A.; McLean, R. S.; Mitchell, G. P.; Onoa, G. B.; Sams, K. D. Nano Lett. 2003, 3, 1007.
16. For example: (a) Walters, D. A.; Casavant, M. J.; Qin, X. C.; Huffman, C. B.; Poul, P. J.; Ericson, L. M.; Haroz, E. H.; O'Connell, M. J.; Smith, K.; Colbert, D. T.; Smalley, R. E. Chem. Phys. Lett. 2001, 338, 14.
17. (b) Zhu, H. W.; Xu, C. L.; Wu, D. H.; Wei, B. Q.; Vajtai, R.; Ajayan, P. M. Science 2002, 296, 884.
18. A Ga FIB (30 kV, 5 nA) was used for rough cut, (30 kV, 3 nA, and 1 nA) for the intermediate cut, which created a rectangular trench from both surfaces of the membrane, followed by a final polish with (10 kV, 100 pA, beam size 20 nm) to remove about 12 nm of amorphous carbon from each FIB cutting face.
19. Gao, G.; Cagin, T.; Goddard, W. A., III. Nanotechnology 1998, 9, 184.
20. Bachilo, S. M.; Strano, M. S.; Kittrell, C.; Hauge, R. H.; Smalley, R. E.; Weisman, R. B. Science 2002, 298, 2361.
21. Huang, S.; Dai, L. J. Phys. Chem. B 2002, 106, 3543.