Electronic and atomic structure of evaporated carbon films

Surface Science

Volumn 359, Issue 1-3, 1996, Pages 227-236

  Schelz, S ^a,b   Richmond, T ^a   Kania, P ^a   Oelhafen, P ^a   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b UNIVERSITÉ DE MONTRÉAL   (Canada)

Author keywords

Amorphous thin films; Carbon; Photoelectron spectroscopy; Raman scattering spectroscopy; Scanning tunneling microscopy

Indexed keywords

CARBON; CRYSTAL ATOMIC STRUCTURE; DEPOSITION; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; EVAPORATION; PHASE TRANSITIONS; PHOTOELECTRON SPECTROSCOPY; RAMAN SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

TEMPERATURE DEPOSITION; VALENCE BAND;

AMORPHOUS FILMS;

EID: 0030190199     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00364-0     Document Type: Article

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