Segregation of Si and Ti in α-alumina

Materials Letters

Volumn 41, Issue 4, 1999, Pages 198-203

  Kebbede, Anteneh ^a   Carim, Altaf H ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; GRAIN BOUNDARIES; METALLOGRAPHIC MICROSTRUCTURE; MORPHOLOGY; SEGREGATION (METALLOGRAPHY); SILICON; SINTERING; SPECTROSCOPIC ANALYSIS; TITANIUM;

ALUMINA PLATELETS; ALUMINOSILICATE LAYER; ANISOTROPIC MICROSTRUCTURE; TITANIA;

ALUMINA;

EID: 0033317367     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(99)00130-5     Document Type: Article

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