X-ray microanalysis in the environmental scanning electron microscope (ESEM): Small size particles analysis limits

Journal De Physique. IV : JP

Volumn 12, Issue 6, 2002, Pages

  Khouchaf, L ^a   Verstraete, J ^a  

^a ECOLE DES MINES DE DOUAI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CONCENTRATION (PROCESS); PARAMETER ESTIMATION; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; X RAY ANALYSIS;

ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE (ESEM); MICROANANLYSIS RESULTS; SKIRT BEAM PHENOMENA; X-RAY MICROANALYSIS;

MICROANALYSIS;

EID: 35348919401     PISSN: 11554339     EISSN: 17647177     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20020242     Document Type: Conference Paper

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