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Volumn , Issue , 2007, Pages 302-311

Power model validation through thermal measurements

Author keywords

Power and thermal measurements

Indexed keywords

CACTI POWER MODELS; POWER AND THERMAL MEASUREMENTS; THERMAL MAPS; THERMAL PACKAGE;

EID: 35348901933     PISSN: 10636897     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1250662.1250700     Document Type: Conference Paper
Times cited : (54)

References (13)
  • 4
    • 33845581110 scopus 로고    scopus 로고
    • Using On-Chip Event Counters For High-Resolution, Real-Time Temperature Measurement. In Thermal and Thermomechanical Phenomena in Electronics Systems
    • May
    • S.-W. Chung and K. Skadron. Using On-Chip Event Counters For High-Resolution, Real-Time Temperature Measurement. In Thermal and Thermomechanical Phenomena in Electronics Systems, 2006, pages 114-120. IEEE Computer Society, May 2006.
    • (2006) 114-120. IEEE Computer Society , pp. 2006
    • Chung, S.-W.1    Skadron, K.2
  • 6
    • 33845598306 scopus 로고    scopus 로고
    • Spatially-resolved imaging of microprocessor power (SIMP): Hotspots in microprocessors. In Thermal and Thermomechanical Phenomena in Electronics Systems
    • May
    • H.F. Hamann, J. Lacey, A. Weger, and J. Wakil. Spatially-resolved imaging of microprocessor power (SIMP): hotspots in microprocessors. In Thermal and Thermomechanical Phenomena in Electronics Systems, 2006, pages 121-125. IEEE Computer Society, May 2006.
    • (2006) 121-125. IEEE Computer Society , pp. 2006
    • Hamann, H.F.1    Lacey, J.2    Weger, A.3    Wakil, J.4
  • 11
    • 0030149507 scopus 로고    scopus 로고
    • CACTI: An Enhanced Cache Access and Cycle Time Model
    • May
    • S. Wilton and N. Jouppi. CACTI: An Enhanced Cache Access and Cycle Time Model. IEEE Journal on Solid-State Circuits, 31(5):677-688, May 1996.
    • (1996) IEEE Journal on Solid-State Circuits , vol.31 , Issue.5 , pp. 677-688
    • Wilton, S.1    Jouppi, N.2
  • 13
    • 34249306904 scopus 로고    scopus 로고
    • Hotleakage: A temperature-aware model of subthreshold and gate leakage for architects
    • Technical Report CS-2003-05, Univ. of Virginia Dept. of Computer Science, March
    • Y. Zhang, D. Parikh, K. Sankaranarayanan, K. Skadron, and M. Stan. Hotleakage: A temperature-aware model of subthreshold and gate leakage for architects. Technical Report CS-2003-05, Univ. of Virginia Dept. of Computer Science, March 2003.
    • (2003)
    • Zhang, Y.1    Parikh, D.2    Sankaranarayanan, K.3    Skadron, K.4    Stan, M.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.