High performance RF MEMS series contact switch - Design and simulations

Proceedings - Electronic Components and Technology Conference

Volumn , Issue , 2007, Pages 158-164

  Lianjun, Liu ^a  

^a FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER SWITCH; METAL SHORTING BAR; PROCESS-INDUCED STRESS;

COMPUTER SIMULATION; CONTACT RESISTANCE; ELECTRIC SWITCHES; INSERTION LOSSES; STRESS ANALYSIS;

MEMS;

EID: 35348838957     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2007.373791     Document Type: Conference Paper

References (7)

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2. J.B. Muldavin and G.M. Rebeiz, "High isolation MEMS shunt switches; part 2: Design," IEEE Trans. on Microwave Theory and Techniques, vol. 48, no. 6, pp. 1053-1056, June 2000.
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