메뉴 건너뛰기




Volumn 82, Issue 2 SPEC. ISS., 2007, Pages 307-310

RBS, XPS, and TEM study of metal and polymer interface modified by plasma treatment

Author keywords

Ion beam analysis; Plasma treatment; Polymer metal interface

Indexed keywords

ION BEAMS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 35248813804     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2007.07.027     Document Type: Article
Times cited : (23)

References (12)
  • 8
    • 35248863175 scopus 로고    scopus 로고
    • NIST-XPS database, 〈http://srdata.nist.gov/xps/〉; 2000.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.