Inexpensive two-tip nanomanipulator for a SEM

Applied Surface Science

Volumn 254, Issue 1 SPEC. ISS., 2007, Pages 405-411

  Nakabayashi, D ^a,b   Silva, P C ^a   Ugarte, D ^a,b  

^a LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

^b UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

Nanomanipulation; Nanomanipulator; Nanowires; Scanning electron microscope (SEM)

Indexed keywords

ELECTRIC FIELD MEASUREMENT; NANOWIRES; PROBES; RESEARCH LABORATORIES; SCANNING ELECTRON MICROSCOPY;

COARSE AND FINE DISPLACEMENTS; ELECTRICAL TWO POINT MEASUREMENTS; INEXPENSIVE MATERIALS; NANOMANIPULATORS; PARALLEL GUIDING PLATE SPRINGS;

NANOSYSTEMS;

EID: 35148896422     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.07.089     Document Type: Article

References (18)

1. Junno T., Deppert K., Montelius L., and Samuelson L. Controlled manipulation of nanoparticles with an atomic force microscope. Appl. Phys. Lett. 66 (1995) 3627-3629
2. Falvo M.R., Clary G.J., Taylor R.M., Chi V., Brooks F.P., Washburn S., and Superfine R. Bending and buckling of carbon nanotubes under large strain. Nature 389 (1997) 582-584
3. Junno T., Carlsson S.B., Xu H.Q., Montelius L., and Samuelson L. Fabrication of quantum devices by Angström-level manipulation of nanoparticles with an atomic force microscope. Appl. Phys. Lett. 72 (1998) 548-550
4. Martin M., Roschier L., Hakonen P., Parts U., Paalanen M., Schleicher B., and Kauppien E.I. Manipulation of Ag nanoparticles utilizing noncontact atomic force microscopy. Appl. Phys. Lett. 73 (1998) 1505-1507
5. Eigler D.M., and Schweizer E.K. Positioning single atoms with a scanning tunneling microscope. Nature 344 (1990) 524-526
6. Nakabayashi D., Silva P.C., González J.C., Rodrigues V., and Ugarte D. Low-cost nanomanipulator for in situ experiments in a FEG-SEM. Microsci. Microanal. 12 (2006) 311-316
7. Yu M.F., Dyer M.J., Skidmore G.D., Rohrs H.W., Lu X.K., Ausman K.D., Von Ehr J.R., and Rouff R.S. Three-dimensional manipulation of carbon nanotubes under a scanning electron microscope. Nanotechnology 10 (1999) 244-252
8. Kim K.S., Lim S.C., Lee I.B., An K.H., Bae D.J., Choi S., Yoo J.-E., and Lee Y.H. In situ manipulation and characterizations using nanomanipulators inside a field emission-scanning electron microscope. Rev. Sci. Instrum. 74 (2003) 4021-4025
9. Lim S.C., Kim K.S., Lee I.B., Jeong S.Y., Cho S., Yoo J.-E., and Lee Y.H. Nanomanipulator-assisted fabrication and characterization of carbon nanotubes inside scanning electron microscope. Micron 36 (2005) 471-476
10. Howell L.L. Compliant Mechanisms (2001), Wiley-Interscience, New York, USA
11. Melmed A. The art and science and other aspects of making sharp tips. J. Vac. Sci. Technol. B 9 (1991) 601-608
12. Ekvall I., Wahlström E., Claesson D., Olin H., and Olsson E. Preparation and characterization of electrochemically etched W tips for STM. Meas. Sci. Technol. 10 (1999) 11-18
13. Ibe J.P., Bey Jr. P.P., Brandow S.L., Brizzolara R.A., Burnham N.A., DiLella D.P., Lee K.P., Marrian C.R.K., and Colton R.J. On the electrochemical etching of tips for scanning tunneling microscopy. J. Vac. Sci. Technol. A 8 (1990) 3570-3575
14. Nakabayashi D., Silva P.C., and Ugarte D. Nanomanipulation and characterization of individual nano-objects inside a SEM. Int. J. Nanotechnol. 4 (2007) 609-617
15. Rong W., Ding W., Mädler L., Ruoff R.S., and Friedlander S.K. Mechanical properties of nanoparticle chain aggregates by combined AFM and SEM: isolated aggregates and networks. Nano Lett. 6 (2006) 2646-2655
16. Dai H.J., Hafner J.H., Rinzler A.G., Colbert D.T., and Smalley R.E. Nanotubes as nanoprobes in scanning probe microscopy. Nature 384 (1996) 147-150
17. Wang Z.L. Nanowires and Nanobelts: Material, Properties and Devices. Metal and Semiconductor Nanowires vol. 1 (2003), Kluwer Academic Publishers, Boston
18. Gonzalez J.C., da Silva M.I.N., Lozano X.S., Zanchet D., Ugarte D., Ribeiro E., Gutierrez H.R., and Cotta M.A. Structural and optical characterization of strained free-standing InP nanowires. J. Nanosci. Nanotechnol. 6 (2006) 2182-2186