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Volumn 53, Issue 2, 2007, Pages 555-560
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Reactivity at the film/solution interface of ex situ prepared bismuth film electrodes: A scanning electrochemical microscopy (SECM) and atomic force microscopy (AFM) investigation
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Author keywords
AFM; Bismuth film electrode; Ex situ; NaBr; Reactivity; SECM
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
BISMUTH;
CRYSTAL GROWTH;
ELECTRODES;
REACTION KINETICS;
THIN FILMS;
BISMUTH FILM ELECTRODES;
GLASSY CARBON SUBSTRATE ELECTRODES;
SCANNING ELECTROCHEMICAL MICROSCOPY (SECM);
INTERFACES (MATERIALS);
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EID: 35048902381
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/j.electacta.2007.07.035 Document Type: Article |
Times cited : (38)
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References (23)
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