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Volumn 53, Issue 2, 2007, Pages 555-560

Reactivity at the film/solution interface of ex situ prepared bismuth film electrodes: A scanning electrochemical microscopy (SECM) and atomic force microscopy (AFM) investigation

Author keywords

AFM; Bismuth film electrode; Ex situ; NaBr; Reactivity; SECM

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH; CRYSTAL GROWTH; ELECTRODES; REACTION KINETICS; THIN FILMS;

EID: 35048902381     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2007.07.035     Document Type: Article
Times cited : (38)

References (23)
  • 13
    • 0003853137 scopus 로고    scopus 로고
    • Bard A.J., and Mirkin M.V. (Eds), Marcel Dekker Inc., New York, Basel
    • In: Bard A.J., and Mirkin M.V. (Eds). Scanning Electrochemical Microscopy (2001), Marcel Dekker Inc., New York, Basel
    • (2001) Scanning Electrochemical Microscopy


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.