메뉴 건너뛰기




Volumn 3299, Issue , 2004, Pages 354-368

Mutation coverage estimation for model checking

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN; ESTIMATION; SPECIFICATIONS;

EID: 35048865012     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-540-30476-0_29     Document Type: Article
Times cited : (15)

References (17)
  • 14
    • 0030388487 scopus 로고    scopus 로고
    • Improving gate level fault coverage by RTL fault grading
    • IEEE Computer Society, October
    • W. Mao and Gulati. R. K. Improving gate level fault coverage by RTL fault grading. In Proceedings of IEEE International Test Conference 1996, Test and Design Validity, pages 150-159. IEEE Computer Society, October 1996.
    • (1996) Proceedings of IEEE International Test Conference , vol.1996 , pp. 150-159
    • Mao, W.1    Gulati, R.K.2
  • 15
    • 0036158371 scopus 로고    scopus 로고
    • Efficient and user-friendly verification
    • January
    • F. Wang and P.-A. Hsiung. "Efficient and user-friendly verification. IEEE Transactions on Computers, 51(1):61-83, January 2002.
    • (2002) IEEE Transactions on Computers , vol.51 , Issue.1 , pp. 61-83
    • Wang, F.1    Hsiung, P.-A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.