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Nano Letters

Volumn 7, Issue 9, 2007, Pages 2747-2752

Electron Shuttle instability for nano electromechanical mass sensing

(6) Stampfer, C a Guttinger J a Roman, C a Jungen, A a Helbling, T a Hierold, C a

a ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSPORT PROPERTIES; ELECTRON TUNNELING; MATHEMATICAL MODELS; MEASUREMENT THEORY; SENSITIVITY ANALYSIS;

DAMPING FORCE; ELECTROMECHANICAL CHARGING; NANOMECHANICAL SENSING;

NANOSTRUCTURES;

NANOMATERIAL;

ARTICLE; CHEMISTRY; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTROMAGNETIC FIELD; ELECTRON TRANSPORT; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; MECHANICAL STRESS; MECHANICS; METHODOLOGY; MOLECULAR WEIGHT; NANOTECHNOLOGY; PARTICLE SIZE; SEMICONDUCTOR; TRANSDUCER; ULTRASTRUCTURE;

ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTROMAGNETIC FIELDS; ELECTRON TRANSPORT; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MECHANICS; MOLECULAR WEIGHT; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SEMICONDUCTORS; STRESS, MECHANICAL; TRANSDUCERS;

EID: 34948911580 PISSN: 15306984 EISSN: None Source Type: Journal
DOI: 10.1021/nl0712419 Document Type: Article

Times cited : (3)

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