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Volumn 5, Issue , 2006, Pages 2284-2289

Power MOSFETs paralleling operation for high power high density converters

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONVERTERS; PARAMETER ESTIMATION; PROBLEM SOLVING; SEMICONDUCTOR JUNCTIONS; THERMAL EFFECTS;

EID: 34948878171     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IAS.2006.256860     Document Type: Conference Paper
Times cited : (22)

References (9)
  • 2
    • 0031232773 scopus 로고    scopus 로고
    • 200°C operation of a 500-W DC-DC converter utilizing power MOSFETs
    • Nelms, R.M., Johnson, R.W., "200°C operation of a 500-W DC-DC converter utilizing power MOSFETs", in IEEE Transactions on Industry Applications, Vol.33, 1997, pp.1267 -1272.
    • (1997) IEEE Transactions on Industry Applications , vol.33 , pp. 1267-1272
    • Nelms, R.M.1    Johnson, R.W.2
  • 3
    • 0034790364 scopus 로고    scopus 로고
    • Xudong Huang, Huijie Yu, Jih-Sheng Lai, Hefner, A.R., Jr., Berning, D.W., Characterization of paralleled super junction MOSFET devices under hard and soft-switching conditions, in proc. IEEE Power Electronics Specialists Conference, 4, 2001, pp.2145-2150.
    • Xudong Huang, Huijie Yu, Jih-Sheng Lai, Hefner, A.R., Jr., Berning, D.W., "Characterization of paralleled super junction MOSFET devices under hard and soft-switching conditions", in proc. IEEE Power Electronics Specialists Conference, Vol.4, 2001, pp.2145-2150.
  • 7
    • 0034474531 scopus 로고    scopus 로고
    • Exact inductive parasitic extraction for analysis of IGBT parallel switching including DCB-backside eddy currents
    • Gutsmann, B., Mourick, P., Silber, D., "Exact inductive parasitic extraction for analysis of IGBT parallel switching including DCB-backside eddy currents", in proc. IEEE Power Electronics Specialists Conference, Vol.3, 2000, pp.1291-1295.
    • (2000) proc. IEEE Power Electronics Specialists Conference , vol.3 , pp. 1291-1295
    • Gutsmann, B.1    Mourick, P.2    Silber, D.3
  • 9
    • 0025413815 scopus 로고
    • Effect of gate resistance on high-frequency power switching efficiencies of advanced power MOSFETs
    • Shenai, K., "Effect of gate resistance on high-frequency power switching efficiencies of advanced power MOSFETs", in IEEE Transactions on Solid-State Circuits, Vol.25, 1990, pp.595 -601.
    • (1990) IEEE Transactions on Solid-State Circuits , vol.25 , pp. 595-601
    • Shenai, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.