Direct determination of dislocation sense of closed-core threading screw dislocations using synchrotron white beam x-ray topography in 4H silicon carbide

Applied Physics Letters

Volumn 91, Issue 14, 2007, Pages

  Chen, Yi ^a   Dudley, Michael ^a  

^a Stony Brook University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAZING INCIDENCE; SCREW DISLOCATION; SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY;

CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); MOLECULAR MODELING; RAY TRACING; SYNCHROTRON RADIATION;

SILICON CARBIDE;

EID: 34948831691     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2793705     Document Type: Article

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