Sense determination of micropipes via grazing-incidence synchrotron white beam x-ray topography in 4H silicon carbide

Applied Physics Letters

Volumn 91, Issue 7, 2007, Pages

  Chen, Y ^a   Dhanaraj, G ^a   Dudley, M ^a   Sanchez, E K ^b   MacMillan, M F ^b  

^a Stony Brook University

^b DOW CORNING CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; SYNCHROTRON RADIATION;

MICROPIPES; RETICULOGRAPHY; X-RAY TOPOGRAPHY;

SILICON CARBIDE;

EID: 34548018799     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2772190     Document Type: Article

References (12)

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