Optical properties of rough LaNiO 3 thin films studied by spectroscopic ellipsometry and reflectometry

Applied Surface Science

Volumn 244, Issue 1-4, 2005, Pages 431-434

  Mistrik, Jan ^a   Yamaguchi, Tomuo ^a   Franta, Daniel ^b   Ohlidal, Ivan ^a   Hu, Gu Jin ^c   Dai, Ning ^c  

^a SHIZUOKA UNIVERSITY   (Japan)

^b MASARYK UNIVERSITY   (Czech Republic)

^c SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

Ellipsometry; LaNiO 3; LNO; Optical constants; Reflectometry

Indexed keywords

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; DEPOSITION; ELLIPSOMETRY; LANTHANUM COMPOUNDS; OPTICAL PROPERTIES; REFLECTOMETERS; SOL-GELS; X RAY DIFFRACTION ANALYSIS;

LANIO3 (LNO); LNO FILMS; OPTICAL CONSTANTS; RAILEIGH-RICE THEORY (RRT);

THIN FILMS;

EID: 15844403104     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.09.151     Document Type: Conference Paper

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