High temperature ellipsometry of the conductive oxide LaNi O3

Journal of Applied Physics

Volumn 101, Issue 2, 2007, Pages

  Berini, B ^a   Noun, W ^a   Dumont, Y ^a   Popova, E ^a   Keller, N ^a  

^a LABORATOIRE DES SCIENCES DU CLIMAT ET DE L ENVIRONNEMENT   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE MATERIALS; ELECTROCHEMICAL ELECTRODES; ELLIPSOMETRY; FILM GROWTH; HIGH TEMPERATURE EFFECTS; LANTHANUM COMPOUNDS; OPTICAL CONSTANTS; PULSED LASER DEPOSITION;

DRUDE-LORENTZ DISPERSION; OXYGEN PRESSURE; SUBSTRATE TEMPERATURE; THERMAL VARIATION;

THIN FILMS;

EID: 33847706931     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2431398     Document Type: Article

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