Structural and thermoelectric properties of Ag-doped Bi2(Te 0.95 Se0.05)3 thin films prepared by flash evaporation

Journal of Physics D: Applied Physics

Volumn 40, Issue 19, 2007, Pages 5971-5974

  Duan, Xingkai ^a   Yang, Junyou ^a   Xiao, Chengjing ^a   Zhu, Wen ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; DOPING (ADDITIVES); SCANNING ELECTRON MICROSCOPY; SILVER; THERMOELECTRICITY; X RAY DIFFRACTION ANALYSIS;

ANNEALED THIN FILMS; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; GLASS SUBSTRATES;

THIN FILMS;

EID: 34748861124     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/40/19/028     Document Type: Article

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