Off-axis dose response characteristics of an amorphous silicon electronic portal imaging device

Medical Physics

Volumn 34, Issue 10, 2007, Pages 3815-3824

  Greer, Peter B ^a,b  

^a CALVARY MATER NEWCASTLE HOSPITAL   (Australia)

^b UNIVERSITY OF NEWCASTLE   (Australia)

Author keywords

Amorphous silicon; Dose verification; EPID

Indexed keywords

IRRADIATION; PIXELS; RADIATION DAMAGE; SENSITIVITY ANALYSIS; SILICON DETECTORS;

AMORPHOUS SILICON (A-SI); CALIBRATION FACTORS; DOSE VERIFICATION; ELECTRONIC PORTAL IMAGING DEVICES; EPID; INDEPENDENT MEASUREMENT; SENSITIVITY VARIATION; SILICON ELECTRONICS;

AMORPHOUS SILICON;

SILICON DIOXIDE;

ARTICLE; ARTIFACT; CALIBRATION; DOSE RESPONSE; ELECTRONIC PORTAL IMAGING DEVICE; INTENSITY MODULATED RADIATION THERAPY; IONIZATION CHAMBER; IRRADIATION; MEDICAL INSTRUMENTATION; PHANTOM; PHOTON; PRIORITY JOURNAL; RADIATION INJURY;

EID: 34748821714     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.2779944     Document Type: Article

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