Compensator quality control with an amorphous silicon EPID

Medical Physics

Volumn 30, Issue 7, 2003, Pages 1816-1824

  Menon, Geetha V ^a   Sloboda, Ron S ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

A Si EPID; Compensator; EPID scatter factor; Quality control

Indexed keywords

AMORPHOUS SILICON; CALIBRATION; IONIZATION CHAMBERS; QUALITY ASSURANCE;

A-SI EPID; COMPENSATOR; OPERATING PARAMETERS; QUADRATIC COMPONENTS; SCATTER FACTOR; SILICON ELECTRONICS; SOURCE-DETECTOR DISTANCE; WATER EQUIVALENT PHANTOMS;

QUALITY CONTROL;

ARTICLE; CALIBRATION; IMAGING SYSTEM; PRIORITY JOURNAL; QUALITY CONTROL; RADIATION PHYSICS; RADIATION SCATTERING; RADIOTHERAPY;

EID: 0038710306     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.1584040     Document Type: Article

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