Calibration of a single-atom detector for atomic microchips

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 76, Issue 3, 2007, Pages

  Stibor, A ^a   Kraft, S ^a,c   Campey, T ^b   Komma, D ^a   Gunther A ^a   Fortagh J ^a   Vale, C J ^b,d   Rubinsztein Dunlop, H ^b   Zimmermann, C ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b UNIVERSITY OF QUEENSLAND   (Australia)

^c UNIVERSITY OF AMSTERDAM   (Netherlands)

^d SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CHARACTERIZATION; ELECTRONS; PHOTOIONIZATION; POISSON DISTRIBUTION;

SINGLE-ATOM DETECTION; SINGLE-ATOM DETECTORS; SUBSEQUENT DETECTION;

MICROPROCESSOR CHIPS;

EID: 34548858183     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.76.033614     Document Type: Article

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