Static SIMS: Ion detection efficiencies in a channel electron multiplier

Applied Surface Science

Volumn 144-145, Issue , 1999, Pages 113-117

  Gilmore, I S ^a   Seah, M P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Channel electron multiplier; Ion detection; Static SIMS

Indexed keywords

ARGON; ELECTRON ENERGY LEVELS; ELECTRON MULTIPLIERS; ION MICROSCOPES; PARTICLE DETECTORS; XENON;

CHANNEL ELECTRON MULTIPLIER; ION DETECTION EFFICIENCIES;

SECONDARY ION MASS SPECTROMETRY;

EID: 3142630550     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00779-X     Document Type: Article

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