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Volumn , Issue , 2007, Pages 70-72

Carbon nanotube transistor circuits: Circuit-level performance benchmarking and design options for living with imperfections

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; CARBON NANOTUBES; CIRCUIT THEORY; CMOS INTEGRATED CIRCUITS; LOGIC DESIGN;

EID: 34548848512     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2007.373592     Document Type: Conference Paper
Times cited : (116)

References (13)
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    • J. Guo, et al., "Performance Analysis and Design Optimisation of Near Ballistic Carbon Nanotube Field-Effect Transistors," Proc. Intl. Electron-Devices Meeting, pp. 703-706, Dec., 2004.
    • (2004) Proc. Intl. Electron-Devices Meeting , pp. 703-706
    • Guo, J.1
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    • D. Kang, et al., "Oxygen-Induced P-type Doping of A Long Individual Single-walled Carbon Nanotube," Nanotechnology, vol. 16, pp. 1048-1062, 2005.
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    • Kang, D.1
  • 8
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    • Effect of Diameter Variation in a Large Set of Carbon Nanotube Transistors
    • Y-C Tseng, et al., "Effect of Diameter Variation in a Large Set of Carbon Nanotube Transistors," Nano Letters, vol. 6, pp. 1864-1368, 2006.
    • (2006) Nano Letters , vol.6 , pp. 1864-1368
    • Tseng, Y.-C.1
  • 10
    • 10744223154 scopus 로고    scopus 로고
    • Preferential Growth of Semiconducting Single-Walled Carbon Nanotubes by a Plasma Enhanced CVD Method
    • Y. Li, et al., "Preferential Growth of Semiconducting Single-Walled Carbon Nanotubes by a Plasma Enhanced CVD Method" Nana Letters, vol. 4, pp. 317, 2004.
    • (2004) Nana Letters , vol.4 , pp. 317
    • Li, Y.1
  • 11
    • 0035957717 scopus 로고    scopus 로고
    • Engineering Carbon Nanotubes and.Nanotube Circuits using Electrical Breakdown
    • P. G. Collins, M. S. Arnolds, and P. Avouris, "Engineering Carbon Nanotubes and.Nanotube Circuits using Electrical Breakdown," Science, vol. 292, pp. 706-709, 2001.
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    • Selective Etching of Metallic Single-Wall Carbon Nanotubes with Hydrogen Plasma
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.