On-die supply-voltage noise sensor with real-time sampling mode for low-power processor applications

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 2007, Pages 290-292

  Sato, Tomio ^a   Inoue, Atsuki ^a   Shiota, Tetsuyoshi ^a   Inoue, Tomoko ^a   Kawabe, Yukihito ^a   Hashimoto, Tetsutaro ^a   Imamura, Toshifumi ^b   Murasaka, Yoshitaka ^b   Nagata, Makoto ^b   Iwata, Atsushi ^b  

^a FUJITSU LABORATORIES LTD   (Japan)

^b A R Tec Corporation   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; MICROPROCESSOR CHIPS; REAL TIME SYSTEMS;

HISTOGRAM COUNTERS; ON-DIE NOISE SENSOR; VARIABLE DETECTION WINDOWS;

SENSORS;

EID: 34548840800     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2007.373408     Document Type: Conference Paper

References (6)

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3. M. Nagata, T. Okumoto, K. Taki, "A Built-in Technique for Probing Power Supply and Ground Noise Distribution Within Large-Scale Digital Integrated Circuits," IEEE J. Solid-State Circuits, vol. 40, no. 4, pp. 813-819, Apr., 2005
4. M. Takamiya and M. Mizuno, "A Sampling Oscilloscope Macro Toward Feedback Physical Design Methodology," Symp. VLSI Circuits, pp. 240-243, Jun., 2004
5. Y. Kanno, Y. Kondoh, T. Irita, et al., "In-Situ Measurement of Supply-Moise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution," Symp. VLSI Circuits Digest of Tech. Papers, pp. 78-79, Jun., 2006
6. A. Muhtaroglu et al., "On-Die Droop Detector for Analog Sensing of Power Supply Noise," IEEE Journal Solid-State Circuits, vol. 39, no. 4, pp. 651-660, Apr., 2004.