In-situ measurement of supply-noise maps with millivolt accuracy and nanosecond-order time resolution

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2006, Pages 63-64

  Kanno, Yusuke ^a   Kondoh, Yuki ^a   Irita, Takahiro ^b   Hirose, Kenji ^b   Mori, Ryo ^b   Yasu, Yoshihiko ^b   Komatsu, Shigenobu ^a   Mizuno, Hiroyuki ^a  

^a HITACHI LTD   (Japan)

^b RENESAS TECHNOLOGY CORP   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT LAYOUT; MOBILE PHONES; TIMING CIRCUITS;

CELLULAR PHONE PROCESSOR; POWER-SUPPLY NETWORKS; TIME RESOLUTION;

POWER SUPPLY CIRCUITS;

EID: 36248951090     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. M. Takamiya et al., VLSI2004, pp. 240-243, Jun. 2004.
2. T. Okumoto et al., VLSI2004, pp. 98-101, Jun. 2004.
3. V. Abramzon et al., ESSCIRC 2005, pp. 463-466, Sept.2005.
4. Y. Kanno et al., ISSCC 2006, 29.4, Feb. 2006.
5. T. Hattori et al., ISSCC 2006, 29.5, Feb. 2006.