Statistical investigation of random telegraph noise ID instabilities in flash cells at different initial trap-filling conditions

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2007, Pages 161-166

  Compagnoni, C Monzio ^a   Gusmeroli, R ^a   Spinelli, A S ^a   Lacaita, A L ^a,b   Bonanomi, M ^c   Visconti, A ^c  

^a POLITECNICO DI MILANO   (Italy)

^b IFN CNR   (Italy)

^c STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DRAIN CURRENT; FLASH MEMORY; RANDOM PROCESSES; SPECTROSCOPIC ANALYSIS; SPURIOUS SIGNAL NOISE;

DRAIN CURRENT INSTABILITY; DRAIN CURRENT MONITORING; FLASH MEMORY ARRAYS; TELEGRAPH NOISE;

TELEGRAPH SYSTEMS;

EID: 34548726828     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2007.369886     Document Type: Conference Paper

References (6)

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