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Volumn T126, Issue , 2006, Pages 6-9
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Annealing study of H2O and O3 grown Al 2O3 deposited by atomic layer chemical vapour deposition on n-type 4H-SiC
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM COMPOUNDS;
ANNEALING;
CHEMICAL VAPOR DEPOSITION;
GROWTH (MATERIALS);
ARGON ATMOSPHERE;
INTERFACE PROPERTIES;
HYDROGEN INORGANIC COMPOUNDS;
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EID: 34548691391
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1088/0031-8949/2006/T126/002 Document Type: Conference Paper |
Times cited : (4)
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References (7)
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