Fabrication of screen-printed field electron emitter using length-controlled and purification-free carbon nanotubes

Applied Physics Letters

Volumn 91, Issue 11, 2007, Pages

  Yoshihara, Kumiko ^a   Fujii, Shunjiro ^a   Kawai, Hideyasu ^a   Ishida, Kazuhiro ^a   Honda, Shin Ichi ^a   Katayama, Mitsuhiro ^a   Oura, Kenjiro ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; CHEMICAL VAPOR DEPOSITION; CURRENT DENSITY; SCREEN PRINTING; SEMICONDUCTOR GROWTH; SUBSTRATES;

EMISSION STABILITY; GROWTH TIME; LENGTH CONTROLLED CARBON NANOTUBES;

FIELD EMISSION;

DEPOSITION; ELECTRONS; SILK SCREEN PRINTING;

EID: 34548688917     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2784194     Document Type: Article

References (11)

1. S. Iijima, Nature (London) 354, 56 (1991).
2. A. Oberlin, M. Endo, and T. Koyama, J. Cryst. Growth 32, 335 (1976).
3. M. S. Dresselhaus, G. Dresselhaus, and P. Avouris, Carbon Nanotubes; Synthesis, Structure, Properties, and Application (Springer, Berlin, 2001).
4. W. B. Choi, D. S. Chung, J. H. Kang, H. Y. Kim, Y. W. Jin, I. T. Han, Y. H. Lee, J. E. Jung, N. S. Lee, G. S. Park, and J. M. Kim, Appl. Phys. Lett. 75, 3129 (1999).
5. Y. C. Kim and E. H. Yoo, Jpn. J. Appl. Phys., Part 2 44, L454 (2005).
6. H. Sugie, M. Tanemura, V. Filip, K. Iwata, K. Takahashi, and F. Okuyama, Appl. Phys. Lett. 78, 2578 (2001).
7. C. Dong and G. R. Myneni, Appl. Phys. Lett. 84, 5443 (2004).
8. A. G. Rinzler, J. Liu, H. Dai, P. Nikolaev, C. B. Huffman, F. J. Rodriguez-Macias, P. J. Boul, A. H. Lu, D. Heymann, D. T. Colbert, R. S. Lee, J. E. Fischer, A. M. Rao, P. C. Eklund, and R. E. Smalley, Appl. Phys. A: Mater. Sci. Process. 67, 29 (1998).
9. S. Fan, M. G. Chapline, N. R. Franklin, T. W. Tombler, A. M. Cassell, and H. Dai, Science 283, 512 (1999).
10. T. J. Vink, M. Gillies, J. C. Kriege, and H. W. J. J. van de Laar, Appl. Phys. Lett. 83, 3552 (2003).
11. L. Nilsson, O. Groening, C. Emmenegger, O. Kuettel, E. Schaller, L. Schlapbach, H. Kind, J.-M. Bonard, and K. Kern, Appl. Phys. Lett. 76, 2071 (2000).