Rutherford back scattering and optical band gap of In/Sb thin films

Indian Journal of Engineering and Materials Sciences

Volumn 14, Issue 3, 2007, Pages 253-256

  Mangal, R K ^a,b   Vijay, Y K ^a   Avasthi, D K ^c   Shekhar, B R ^d  

^a UNIVERSITY OF RAJASTHAN   (India)

^b Jaipur Engineering College and Research Centre   (India)

^c INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^d INSTITUTE OF PHYSICS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTANT THICKNESS; GLASS SUBSTRATES; IRRADIATED SAMPLES; ROOM TEMPERATURE; RUTHERFORD BACK-SCATTERING; SWIFT HEAVY IONS; VACUUM EVAPORATION METHOD; VARYING THICKNESS;

BACKSCATTERING; MIXING; OPTICAL BAND GAPS; SUBSTRATES; THIN FILMS;

SILVER;

EID: 34548649490     PISSN: 09714588     EISSN: 09751017     Source Type: Journal    
DOI: None     Document Type: Article

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