Structural evolution of Fe-Al multilayer thin films for different annealing temperatures

Journal of Physics Condensed Matter

Volumn 13, Issue 5, 2001, Pages 811-821

  Checchetto, R ^a   Tosello, C ^a   Miotello, A ^a   Principi, G ^b  

^a UNIVERSITY OF TRENTO   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ANNEALING; ELECTRON BEAMS; EVAPORATION; HIGH TEMPERATURE EFFECTS; IRON; MOSSBAUER SPECTROSCOPY; MULTILAYERS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STRUCTURE (COMPOSITION); X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY;

ANNEALING TEMPERATURE; CONVERSION ELECTRON MOSSBAUER SPECTROSCOPY; ELECTRON BEAM EVAPORATION; PHASE FORMATION; STRUCTURAL EVOLUTION; X RAY DIFFRACTION SPECTROSCOPY;

THIN FILMS;

EID: 0034826147     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/13/5/303     Document Type: Article

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