Microstructure and defect investigations of the as-grown and annealed ZnO/Si thin films

Journal of Applied Physics

Volumn 102, Issue 5, 2007, Pages

  Huang, Jingyun ^a   Lu, Huanming ^a   Ye, Zhizhen ^a   Wang, Lei ^a   Zhao, Binghui ^a   He, Haiping ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; GROWTH (MATERIALS); HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROSTRUCTURE; SURFACE DEFECTS; ZINC OXIDE;

COLUMNAR GRAINS; CROSS-SECTIONAL BRIGHT-FIELD TEM IMAGES; LOW-ANGLE BOUNDARIES;

THIN FILMS;

EID: 34548642147     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2773633     Document Type: Article

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