Microstructure and defects of wurtzite structure thin films

Journal of the European Ceramic Society

Volumn 19, Issue 6-7, 1999, Pages 1427-1430

  Sagalowicz, Laurent ^a   Fox, Glen R ^a   Dubois, Marc Alexandre ^a   Muller, Claude A P ^a   Muralt, Paul ^a   Setter, Nava ^a  

^a EPFL   (Switzerland)

Author keywords

Defects; Electron microscopy; Films; ZnO

Indexed keywords

ALUMINUM COMPOUNDS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; DISLOCATIONS (CRYSTALS); SILICA; SPUTTERING; STACKING FAULTS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; ZIRCONIA;

COLUMNAR MICROSTRUCTURE; WURTZITE STRUCTURE;

THIN FILMS;

EID: 0032691328     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(98)00453-1     Document Type: Article

References (9)

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