Nd-substituted SrBi2Ta2O9 ferroelectric thin films prepared by radio frequency magnetron sputtering

Thin Solid Films

Volumn 515, Issue 23, 2007, Pages 8371-8375

  Li, Yibin ^a   Zhang, Sam ^a   Fei, Weidong ^b   Sritharan, Thirumany ^c   Xu, Cong ^c  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b HARBIN INSTITUTE OF TECHNOLOGY   (China)

^c NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Coercivity; Magnetron sputtering; Remnant polarization; SBT thin film; Substitution

Indexed keywords

ANNEALING; COERCIVE FORCE; MAGNETRON SPUTTERING; MASS SPECTROMETRY; NEODYMIUM; POLARIZATION; POLYCRYSTALLINE MATERIALS; X RAY PHOTOELECTRON SPECTROSCOPY;

REMNANT POLARIZATION; SBT THIN FILM;

FERROELECTRIC THIN FILMS;

EID: 34548636720     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.04.032     Document Type: Article

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