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Volumn 88, Issue 4, 2007, Pages 551-555
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Confocal optical beam induced current microscopy of light-emitting diodes with a white-light supercontinuum source
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Author keywords
[No Author keywords available]
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Indexed keywords
CONFOCAL MICROSCOPY;
LIGHT ABSORPTION;
LIGHT EMISSION;
NONDESTRUCTIVE EXAMINATION;
SEMICONDUCTOR DEVICES;
WAVELENGTH;
CONFOCAL OPTICAL BEAM INDUCED CURRENT MICROSCOPY;
OPTICAL BEAM INDUCED CURRENT (OBIC);
VISIBLE SPECTRUM;
WHITE-LIGHT SUPERCONTINUUM SOURCE;
LIGHT EMITTING DIODES;
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EID: 34548621720
PISSN: 09462171
EISSN: None
Source Type: Journal
DOI: 10.1007/s00340-007-2758-8 Document Type: Article |
Times cited : (8)
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References (21)
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