Interpretation of current flow in photodiode structures using laser beam-induced current for characterization and diagnostics

IEEE Transactions on Electron Devices

Volumn 53, Issue 1, 2006, Pages 23-31

  Redfern, David A ^b,c   Smith, E P G ^b,d   Musca, Charles A ^a,b   Dell, John M ^a,b   Faraone, Lorenzo ^a,b  

^a IEEE   (Australia)

^b UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

^c UNIVERSITY OF TOKYO   (Japan)

^d RAYTHEON COMPANY   (United States)

Author keywords

Laser beam induced current (LBIC); Nondestructive characterization; Optical beam induced current (OBIC); Photodiode

Indexed keywords

LASER BEAM INDUCED CURRENT (LBIC); NONDESTRUCTIVE CHARACTERIZATION; OPTICAL BEAM INDUCED CURRENT (OBIC);

COMPUTER SIMULATION; DARK CURRENTS; ELECTRIC CURRENTS; ELECTRIC LOAD FLOW; LASER BEAMS; SEMICONDUCTOR JUNCTIONS;

PHOTODIODES;

EID: 33947669419     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2005.860779     Document Type: Article

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