메뉴 건너뛰기




Volumn 364, Issue 6, 1999, Pages 551-555

Direct determination of trace copper and chromium in silicon nitride by fluorinating electrothermal vaporization inductively coupled plasma atomic emission spectrometry with the slurry sampling technique

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001271678     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160051384     Document Type: Article
Times cited : (15)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.