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Volumn 364, Issue 6, 1999, Pages 551-555
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Direct determination of trace copper and chromium in silicon nitride by fluorinating electrothermal vaporization inductively coupled plasma atomic emission spectrometry with the slurry sampling technique
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001271678
PISSN: 09370633
EISSN: None
Source Type: Journal
DOI: 10.1007/s002160051384 Document Type: Article |
Times cited : (15)
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References (23)
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