|
Volumn 56, Issue 9, 2001, Pages 1645-1656
|
Direct solid-sampling electrothermal atomic absorption spectrometry methods for the determination of silicon in oxides of niobium, titanium and zirconium
a a |
Author keywords
Electrothermal atomic absorption spectrometry; Niobium pentoxide; Silicon determination; Solid sampling; Titanium dioxide; Zirconium dioxide
|
Indexed keywords
ATOMIZATION;
GRAPHITE;
PYROLYSIS;
SILICON;
SOLUTIONS;
SOLID SAMPLINGS;
SPECTROMETRY;
|
EID: 0035975510
PISSN: 05848547
EISSN: None
Source Type: Journal
DOI: 10.1016/S0584-8547(01)00255-5 Document Type: Article |
Times cited : (34)
|
References (36)
|