X-ray, micro-Raman, and infrared spectroscopy structural characterization of self-assembled multilayer silane films with variable numbers of stacked layers

Langmuir

Volumn 18, Issue 10, 2002, Pages 3916-3922

  Baptiste, A ^a   Gibaud, A ^a   Bardeau, J F ^a   Wen, K ^b   Maoz, R ^b   Sagiv, J ^b   Ocko, B M ^c  

^a UNIVERSITÉ DU MAINE   (France)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED SPECTROSCOPY; MOLECULAR STRUCTURE; RAMAN SPECTROSCOPY; SELF ASSEMBLY; SILANES; SURFACE CHEMISTRY; X RAY SPECTROSCOPY;

ORGANOSILANES;

LANGMUIR BLODGETT FILMS;

EID: 0037076616     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la015572r     Document Type: Article

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