Electronic structure of a heterostructure of an alkylsiloxane self-assembled monolayer on silicon

Physical Review B - Condensed Matter and Materials Physics

Volumn 58, Issue 24, 1998, Pages 16491-16498

  Vuillaume, D ^a   Boulas, C ^a   Collet, J ^a   Allan, G ^a   Delerue, C ^a  

^a Institut Superieur de l'Electronique et du Numerique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001019156     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.16491     Document Type: Article

References (42)

1. (a) C. Boulas, J. V. Davidovits, F. Rondelez, and D. Vuillaume, Phys. Rev. Lett. 76, 4797 (1997).
2. (b) D. Vuillaume, C. Boulas, J. Collet, J. V. Davidovits, and F. Rondelez, Appl. Phys. Lett. 69, 1646 (1997).
3. W. C. Bigelow, D. L. Pickett, and W. A. Zisman, J. Colloid. Sci. 1, 513 (1946).
4. R. Maoz and J. Sagiv, J. Colloid Interface Sci. 100, 465 (1984).
5. E. Bergignat, A. Gagnaire, and G. Hollinger (private communication).
6. R. Saoudi, G. Hollinger, A. Gagnaire, P. Ferret, and M. Pitival, J. Phys. III 3, 1479 (1993).
7. J.-B. Brzoska, N. Shahidzadeh, and F. Rondelez, Nature (London) 360, 719 (1992).
8. J.-B. Brzoska, I. Ben Azouz, and F. Rondelez, Langmuir 10, 4367 (1994).
9. A. N. Parikh, D. L. Allara, I. B. Azouz, and F. Rondelez, J. Phys. Chem. 98, 7577 (1994).
10. D. L. Allara, A. N. Parikh, and F. Rondelez, Langmuir 11, 2357 (1995).
11. LangmuirD. L. Angst and G. W. Simmons, 7, 2236 (1991).
12. LangmuirJ. D. Le Grange, J. L. Markham, and C. R. Kurkjian, 9, 1749 (1993).
13. LangmuirC. P. Tripp and M. L. Hair, 8, 1120 (1992).
14. LangmuirM. E. Mc Govern, K. M. R. Kallury, and M. Thompson, 10, 3607 (1994).
15. We used the extrapolation technique of Zisman [W. A. Zisman, Adv. Chem. Ser. 43, 1 (1964)] in which the contact angles for sessile drops of homologous apolar liquids are plotted as a function of their liquid-vapor interfacial energy (Formula presented) To measure the contact angles, we used an optical method described in detail elsewhere (Ref. 6). We also used a remote-computer controlled goniometer system (DIGIDROP by GBX, France) to measure water contact angles greater than 90° on silanized surfaces, values for which the above method cannot be used. Advancing and receding angles were measured using a tilted sample holder table. All measurements (both techniques) were made in ambient atmosphere and at room temperature.
16. A. Ulman, An Introduction to Ultrathin Organic Films: From Langmuir-Blodgett to Self-Assembly (Academic, San Diego, 1991).
17. S. R. Wassermam, Y. T. To, and G. M. Whitesides, Langmuir 5, 1074 (1989).
18. D. Vuillaume, in Amorphous and Crystalline Insulating Thin Films, edited by W. L. Warren, R. A. Devine, M. Matsumura, S. Cristoloveanu, Y. Homma, and J. Kanicki, MRS Symposia Proceedings No. 446 (Materials Research Society, Pittsburgh, 1997), p. 79;J. Collet, Ph.D. thesis, University of Lille, 1997.
19. P. Fontaine, D. Goguenheim, D. Deresmes, D. Vuillaume, M. Garet, and F. Rondelez, Appl. Phys. Lett. 62, 2256 (1993).
20. R. J. Powell, J. Appl. Phys. 41, 2424 (1970).
21. S. M. Sze, Physics of Semiconductor Devices (Wiley, New York, 1981).
22. E. R. Nicollian and J. R. Brews, MOS Physics and Technology (Wiley, New York, 1982).
23. S. Horiguchi and H. Yoshino, J. Appl. Phys. 58, 1597 (1985); see also Ref. 1(b) and references therein.
24. EELS experiments were performed with a homemade system using a cylindrical mirror analysis (CMA). The samples are bombarded with a primary electrons at (Formula presented) normal incidence, and in a standard single-pass CMA pulse counting mode. We applied an EELS procedure describe in P. Poveda and A. Glachant, Surf. Sci. 323, 258 (1995).
25. R. Stratton, J. Phys. Chem. Solids 23, 1177 (1962).
26. K. J. Less and E. G. Wilson, J. Phys. C 6, 3110 (1973).
27. N. Ueno, W. Gädeke, E. E. Koch, R. Engelhardt, R. Dudde, L. Laxhuber, and H. Möhwald, J. Mol. Electron. 1, 19 (1985).
28. K. Segi, U. Kartsson, E. Engelhardt, and E. E. Koch, Chem. Phys. Lett. 103, 343 (1984).
29. A. Karpfen, J. Chem. Phys. 75, 238 (1981), and references therein for a detailed review of theoretical results. See also Ref. 20 for quoted values.
30. M. S. Miao, P. E. van Camp, V. E. van Doren, J. J. Ladik, and J. W. Minimire, Phys. Rev. B 54, 10 430 (1996).
31. B. Montanari and R. O. Jones, Chem. Phys. Lett. 272, 347 (1997).
32. L. J. Sham and M. Schüter, Phys. Rev. Lett. 51, 1888 (1983).
33. Phys. Rev. Lett.J. P. Perdew and M. Levy, 51, 1884 (1983).
34. S. J. Vosko, L. Wilk, and M. Nusair, Can. J. Phys. 58, 1200 (1980).
35. C. Priester, G. Allan, and M. Lannoo, Phys. Rev. B 33, 7386 (1986).
36. J. Robertson, Philos. Mag. B 66, 615 (1992).
37. J. C. Slater and G. F. Koster, Phys. Rev. 94, 1498 (1954).
38. I. M. Tidswell, B. M. Ocko, P. S. Perghan, S. R. Wasaerman, G. M. Whitesides, and J. D. Axe, Phys. Rev. B 41, 1111 (1990).
39. C. Priester, G. Allan, and M. Lannoo, Phys. Rev. Lett. 58, 1989 (1987).
40. V. Fiorentini and A. Baldereschi, Phys. Rev. B 51, 17 196 (1995).
41. J. Collet, O. Tharaud, C. Legrand, A. Chapoton, and D. Vuillaume (Ref. 37).
42. J. Collet and D. Vuillaume, Appl. Phys. Lett. (to be published).