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Volumn 91, Issue 19, 2007, Pages 1831-1835
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Temperature-induced metal-semiconductor transition in W-doped VO2 films studied by photoelectron spectroscopy
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Author keywords
Metal semiconductor transition; Photoelectron spectroscopy; Tungsten; Vanadium oxide
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Indexed keywords
CONCENTRATION (PROCESS);
CORE ANALYSIS;
PHOTOELECTRON SPECTROSCOPY;
THIN FILMS;
TUNGSTEN;
VALENCE BANDS;
VANADIUM COMPOUNDS;
METAL-SEMICONDUCTOR TRANSITION;
SEMICONDUCTOR TRANSITION;
VANADIUM OXIDE;
PHASE TRANSITIONS;
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EID: 34548539625
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solmat.2007.06.013 Document Type: Article |
Times cited : (103)
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References (21)
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