Light emission and scanning electron microscopic characterization of porous silicon

Spectroscopy Letters

Volumn 40, Issue 5, 2007, Pages 753-762

  Berrada, K ^a   Targaoui, H ^a   Kaddouri, A ^a   Louarn, G ^b   Froyer, G ^b   Outzourhit, A ^a  

^a FACULTÉ DES SCIENCES SEMLALIA   (Morocco)

^b INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

Light emission; Oxidized silicon; Porosity; Porous silicon; SEM; Sputtering

Indexed keywords

EID: 34548502923     PISSN: 00387010     EISSN: 15322289     Source Type: Journal    
DOI: 10.1080/00387010701429351     Document Type: Article

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