Kinetic Process of Reoxidation of Base Metal Technology BaTiO 3-Based Multilayer Capacitors

Journal of the American Ceramic Society

Volumn 86, Issue 11, 2003, Pages 1879-1884

  Opitz, Mathew R ^a,b   Albertsen, Knuth ^a,c   Beeson, James J ^a,d   Hennings, Detlev F ^a,e   Routbort, Jules L ^a,f   Randall, Clive A ^b  

^a AMERICAN CERAMIC SOCIETY   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c Ferro Electronic Material Systems   (Netherlands)

^d KEMET ELECTRONICS CORPORATION   (United States)

^e PHILIPS RESEARCH LABORATORIES   (Germany)

^f ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; ELECTRIC FIELDS; ELECTRODES; FINITE ELEMENT METHOD; OXIDATION; PARTIAL PRESSURE; QUENCHING; SECONDARY ION MASS SPECTROMETRY; SURFACE REACTIONS; THERMOGRAVIMETRIC ANALYSIS;

BASE METAL TECHNOLOGY; ELECTRICAL DEGRADATION; ELECTRICAL RELIABILITY;

CERAMIC CAPACITORS;

EID: 0344443647     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2003.tb03576.x     Document Type: Article

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