Simplified RF noise de-embedding method for on-wafer CMOS FET

Electronics Letters

Volumn 43, Issue 18, 2007, Pages 1000-1001

  Xiong, Y Z ^a   Issaoun, A ^a   Nan, L ^a   Shi, J ^a   Mouthaan, K ^b  

^a INSTITUTE OF MICROELECTRONICS   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; EMBEDDED SYSTEMS; SILICON WAFERS; SPURIOUS SIGNAL NOISE;

DE-EMBEDDING METHODS; IN/OUT INTERCONNECTIONS; PARASITIC EFFECTS;

FIELD EFFECT TRANSISTORS;

EID: 34548337091     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20071442     Document Type: Article

References (7)

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2. Chen, C.H., and Deen, M.J.: ' A general noise and S-parameter de-embedding procedure for on-wafer high-frequency noise measurements of MOSFETs ', IEEE Trans. Microw. Theory Tech., 2001, 49, (5), p. 1004-1004 10.1109/22.920164 0018-9480
3. Guo, J.-C., and Lin, Y.-M.: ' A new lossy substrate de-embedding method for Sub-100nm RF CMOS noise extraction and modeling ', IEEE Trans. Electron Devices, 2006, 53, (2), p. 339-347 10.1109/TED.2005.862699 0018-9383
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7. Aufinger, K., and Bock, J.: ' A straightforward noise de-embedding method and its application to high-speed silicon bipolar transistors ', Proc. ESSDERC, 1996, p. 957-960