A novel cascade-based de-embedding method for on-wafer microwave characterization and automatic measurement

IEEE MTT-S International Microwave Symposium Digest

Volumn 2, Issue , 2004, Pages 1237-1240

  Cho, Ming Hsiang ^a   Huang, Guo Wei ^a   Chen, Kun Ming ^a   Peng, An Sam ^a  

^a NATIONAL NANO DEVICE LABORATORIES   (Taiwan)

Author keywords

Automatic measurement; Cascade configuration; De embedding; On wafer; Scattering parameter

Indexed keywords

AUTOMATIC MEASUREMENTS; CASCADE CONFIGURATION; DE-EMBEDDING; ON-WAFER; RF CIRCUITS; SCATTERING PARAMETER;

AUTOMATION; CAPACITANCE; CASCADE CONNECTIONS; CMOS INTEGRATED CIRCUITS; INDUCTANCE; MIM DEVICES; NETWORKS (CIRCUITS);

MICROWAVES;

EID: 4444373483     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. M. C. A. M. Koolen et al, "An improved de-embedding technique for on-wafer high-frequency characterization," in IEEE Bipolar Circuits Technol. Meeting, 1991, pp. 188-191.
2. S. Lee et al, "A new parameter extraction technique for small-signal equivalent circuit of polysilicon emitter bipolar transistors," IEEE Trans. Electron Devices, vol. 41, pp. 233-238, Feb. 1994.
3. C. H. Chen et al, "A general noise and S-parameter deembedding procedure for on-wafer high-frequency noise measurements of MOSFETs," IEEE Trans. Microwave Theory Tech., vol. 49, pp. 1004-1005, May 2001.
4. th ARFTG Conference, Jun. 2003.
5. W. R. Eisenstadt et al, "S-parameter-based IC interconnect transmission line characterization," IEEE Trans. Compon., Hybrids, Manufact. Tech., vol. 15, pp. 483-490, Aug. 1992.