Near-field stacking of zone plates in the x-ray range

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4783, Issue , 2002, Pages 74-81

  Maser, J ^a   Lai, B ^a   Yun, W ^b   Shastri, S D ^a   Cai, Z ^a   Rodrigues, W ^a   Xu, S ^a   Trackhtenberg, E ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b XRADIA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; DIFFRACTION GRATINGS; FOCUSING; LIGHT ABSORPTION; LIGHTING; OPTICAL RESOLVING POWER; PHOTOELECTRICITY; PHOTONS; RAYLEIGH SCATTERING; REFRACTIVE INDEX; STACKING FAULTS; X RAYS;

FOCUSING OPTICS; FRESNEL ZONE PLATES; NEAR FIELD STACKING; X RAY MICROPROBES;

X RAY OPTICS;

EID: 0036986319     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.451396     Document Type: Conference Paper

References (13)

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