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Volumn 54, Issue 4, 2007, Pages 821-827

Performance-limiting defects in CdZnTe detectors

Author keywords

CdZnTe; Semiconductor detectors; Te inclusions

Indexed keywords

CADMIUM ALLOYS; DEFECTS; GAMMA RAYS; GEOMETRY; INCLUSIONS; PARAMETER ESTIMATION; X RAYS;

EID: 34548089858     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.894555     Document Type: Conference Paper
Times cited : (76)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.