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edited by M. D. Furnish, L. C. Chhabildas, and R. S. Hixson, AIP Conf. Proc. No. 505 AIP, Melville, NY
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L. M. Barker, in Shock Compression of Condensed Matter 1999, edited by M. D. Furnish, L. C. Chhabildas, and R. S. Hixson, AIP Conf. Proc. No. 505 (AIP, Melville, NY, 1999), p. 11.
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Barker, L.M.1
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Proceedings shock compression of condensed matter
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AIP, biannual 1987-2001, and Office of Naval Research
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Reviews of many aspects of shock wave research can be found in the proceedings Shock Compression of Condensed Matter, AIP, biannual 1987-2001, and First through Eleventh Symposium (International) on Detonation, Office of Naval Research, 1951-1998.
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(1951)
Eleventh Symposium (International) on Detonation
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3
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K. T. Gahagan, D. S. Moore, D. J. Funk, J. H. Reho, and R. L. Rabie, J. Appl. Phys. 92, 3679 (2002).
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Gahagan, K.T.1
Moore, D.S.2
Funk, D.J.3
Reho, J.H.4
Rabie, R.L.5
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4
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79956056511
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S. D. McGrane, D. S. Moore, D. J. Funk, and R. L. Rabie, Appl. Phys. Lett. 80, 3919 (2002).
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Appl. Phys. Lett.
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McGrane, S.D.1
Moore, D.S.2
Funk, D.J.3
Rabie, R.L.4
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S. C. Schmidt, D. Schiferl, A. S. Zinn, D. D. Ragan, and D. S. Moore, J. Appl. Phys. 69, 2793 (1991).
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Schmidt, S.C.1
Schiferl, D.2
Zinn, A.S.3
Ragan, D.D.4
Moore, D.S.5
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10
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S. A. Hambir, J. Franken, D. E. Hare, E. L. Chronister, B. J. Baer, and D. D. Dlott, J. Appl. Phys. 81, 2157 (1997).
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Hambir, S.A.1
Franken, J.2
Hare, D.E.3
Chronister, E.L.4
Baer, B.J.5
Dlott, D.D.6
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11
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Z. A. Dreger, Y. A. Gruzdkov, Y. A. Gupta, and J. J. Dick, J. Phys. Chem. B 106, 247 (2002).
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J. Phys. Chem. B
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Gruzdkov, Y.A.2
Gupta, Y.A.3
Dick, J.J.4
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13
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0005310175
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edited by S. C. Schmidt and N. C. Holmes AIP, Woodbury, NY, and references therein
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D. S. Moore and S. C. Schmidt, in Shock Waves in Condensed Matter 1987, edited by S. C. Schmidt and N. C. Holmes (AIP, Woodbury, NY, 1988), p. 35, and references therein.
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Shock Waves in Condensed Matter 1987
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Moore, D.S.1
Schmidt, S.C.2
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16
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0003881170
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edited by M. Bass McGraw-Hill, New York
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R. M. A. Azzam, in Handbook of Optics, Vol. II, edited by M. Bass (McGraw-Hill, New York, 1995).
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(1995)
Handbook of Optics
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Azzam, R.M.A.1
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20
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0038301489
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note
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The interference effects will be significantly reduced if the sample roughness, or variation in thickness, approaches a significant fraction of the wavelength of the light. This accounts for the lack of interference observed in macroscopic shock interferometry experiments.
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21
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0038640450
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note
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Previous observation of nearly linear (with some oscillations superimposed) time dependent phase data in nitrocellulose films provided initial support for the assumption of a constant particle velocity (Ref. 4).
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22
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0038977518
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edited by Y. M. Gupta, Plenum Press, New York
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J. L. Wise and L. C. Chhabildas, in Shock Waves in Condensed Matter 1985, edited by Y. M. Gupta, (Plenum Press, New York, 1985), p. 441.
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(1985)
Shock Waves in Condensed Matter 1985
, pp. 441
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Wise, J.L.1
Chhabildas, L.C.2
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24
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0035884104
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The phase shifts reported in, due to optical changes in the shocked Al are <0.05 rad, making them negligible for the much larger phase shifts studied here
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The phase shifts reported in D. J. Funk, D. S. Moore, K. T. Gahagan, S. J. Buelow, J. H. Reho, G. L. Fisher, and R. L. Rabie, Phys. Rev. B 64, 115114 (2000), due to optical changes in the shocked Al are <0.05 rad, making them negligible for the much larger phase shifts studied here.
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(2000)
Phys. Rev. B
, vol.64
, pp. 115114
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Funk, D.J.1
Moore, D.S.2
Gahagan, K.T.3
Buelow, S.J.4
Reho, J.H.5
Fisher, G.L.6
Rabie, R.L.7
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25
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0037626013
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s could possibly be independently measured by transit time through various thicknesses of PMMA coated with a reflective layer
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s could possibly be independently measured by transit time through various thicknesses of PMMA coated with a reflective layer.
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26
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0003596959
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University of California, Berkeley, CA
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S. P. Marsh, LASL Shock Hugoniot Data (University of California, Berkeley, CA, 1980).
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(1980)
LASL Shock Hugoniot Data
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Marsh, S.P.1
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27
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0033896306
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The refractive indices at 632.8 nm, n = 1.492, and 800 nm, n = 1.487, are from
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The refractive indices at 632.8 nm, n = 1.492, and 800 nm, n = 1.487, are from T. Ishigure, Y. Koike, and J. W. Fleming, J. Lightwave Technol. 18, 178 (2000).
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(2000)
J. Lightwave Technol.
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, pp. 178
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Ishigure, T.1
Koike, Y.2
Fleming, J.W.3
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29
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0037626007
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note
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Spot size and profile were measured with spatially resolved interferometry data at 200 ps. Use of higher energies than those employed here often led to self-focusing that caused a spike in the center of the Gaussian profile. No data influenced by self focusing were reported here.
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30
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0037626008
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note
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The spectrally clipped pulse is slightly chirped from ∼155 fs to 200 fs to expand the spatial region of overlap between the sample and reference pulses in the interferometer. This is required to achieve sufficient fringe contrast over the entire shocked region at the magnification employed.
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31
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0037625990
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3 layer was treated as constant thickness and refractive index, which is not critical due to its small thickness of 5 nm
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3 layer was treated as constant thickness and refractive index, which is not critical due to its small thickness of 5 nm.
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32
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0000991106
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edited by E. D. Palik (Academic Press, San Diego, CA)
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D. Y. Smith, E. Shiles, and Mitio Inokuti, in Handbook of Optical Constants of Solids, edited by E. D. Palik (Academic Press, San Diego, CA, 1998), p. 369.
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(1998)
Handbook of Optical Constants of Solids
, pp. 369
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Smith, D.Y.1
Shiles, E.2
Inokuti, M.3
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34
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0037964304
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edited by S. C. Schmidt, J. N. Johnson, and L. W. Davison Elsevier, Amsterdam
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M. Hayek and G. Luttwak, in Shock Compression of Condensed Matter 1989, edited by S. C. Schmidt, J. N. Johnson, and L. W. Davison (Elsevier, Amsterdam, 1990), p. 779.
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(1990)
Shock Compression of Condensed Matter 1989
, pp. 779
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Hayek, M.1
Luttwak, G.2
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35
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0037964303
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M. Hayek, D. Segal, G. Luttwak, A. Birnboim, and Y. Carmel, Proc. SPIE 491, 632 (1984).
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(1984)
Proc. SPIE
, vol.491
, pp. 632
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Hayek, M.1
Segal, D.2
Luttwak, G.3
Birnboim, A.4
Carmel, Y.5
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37
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0038301482
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note
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Caution is advised against untested extension of the agreement between thin film and bulk Hugoniots to nonglassy materials, where structural properties (such as crystal defects or grain boundaries) may occur on length scales larger than the film thickness.
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