Ensembles of neural networks for fault diagnosis in analog circuits

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 23, Issue 4, 2007, Pages 323-339

  El Gamal, M A ^a   Mohamed, M D A ^a  

^a CAIRO UNIVERSITY   (Egypt)

Author keywords

Analog circuits; Bagging; Boosting; Ensemble learning; Fault classification; Fault simulation

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; FAILURE ANALYSIS; NEURAL NETWORKS; PHASE MEASUREMENT;

BAGGING; ENSEMBLE LEARNING; FAULT CLASSIFICATION; FAULT SIMULATION;

ANALOG CIRCUITS;

EID: 34547913484     PISSN: 09238174     EISSN: 15730727     Source Type: Journal    
DOI: 10.1007/s10836-006-0710-1     Document Type: Article

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