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Volumn 28, Issue 3, 2000, Pages 147-158

Fault diagnosis of electronic analog circuits using a radial basis function network classifier

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FAILURE ANALYSIS; LINEAR INTEGRATED CIRCUITS; NEURAL NETWORKS;

EID: 0034301836     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(00)00008-7     Document Type: Article
Times cited : (80)

References (11)
  • 1
    • 0342782188 scopus 로고
    • Geneva, Switzerland: International Electrotechnical Vocabulary
    • International Standard CEI IEC 50 (191). 1990;International Electrotechnical Vocabulary, Geneva, Switzerland.
    • (1990) International Standard CEI IEC 50 (191)
  • 2
    • 0022107260 scopus 로고
    • Fault diagnosis of analog circuits
    • Bandler J.W., Salama A.E. Fault diagnosis of analog circuits. Proc. IEEE. 73:(8):1985;1279-1325.
    • (1985) Proc. IEEE , vol.73 , Issue.8 , pp. 1279-1325
    • Bandler, J.W.1    Salama, A.E.2
  • 4
    • 0030079923 scopus 로고    scopus 로고
    • On the application of neural network to fault diagnosis of electronic analog circuits
    • Catelani M., Gori M. On the application of neural network to fault diagnosis of electronic analog circuits. Measurement. 17:1996;73-80.
    • (1996) Measurement , vol.17 , pp. 73-80
    • Catelani, M.1    Gori, M.2
  • 5
    • 0001900396 scopus 로고
    • Test and design for testability of analog and mixed-signal integrated circuits: Theoretical basis and pragmatical approaches
    • Davos. Chapter 2
    • Huertas J.L. Test and design for testability of analog and mixed-signal integrated circuits: theoretical basis and pragmatical approaches. ECCTD '93 Circuit Theory and Design '93: Selected Topics in Circuits and Systems. 1993;75-151 Davos. Chapter 2.
    • (1993) ECCTD '93 Circuit Theory and Design '93: Selected Topics in Circuits and Systems , pp. 75-151
    • Huertas, J.L.1
  • 6
    • 0026135904 scopus 로고
    • Radial basis function networks for classifying process faults
    • Leonard J.A., Kramer M.A. Radial basis function networks for classifying process faults. IEEE Contr. Syst. 11:1991;31-37.
    • (1991) IEEE Contr. Syst. , vol.11 , pp. 31-37
    • Leonard, J.A.1    Kramer, M.A.2
  • 9
    • 0001941795 scopus 로고
    • Diagnosing dynamic faults using modular neural nets
    • Leonard J.A., Kramer M.A. Diagnosing dynamic faults using modular neural nets. IEEE Expert. 1993;44-53.
    • (1993) IEEE Expert , pp. 44-53
    • Leonard, J.A.1    Kramer, M.A.2
  • 10
    • 0026899193 scopus 로고
    • Using radial basis functions to approximate function and its error bounds
    • Leonard J.A., Kramer M.A., Ugar L.H. Using radial basis functions to approximate function and its error bounds. IEEE Trans. Neural Net. 3:(4):1991;624-627.
    • (1991) IEEE Trans. Neural Net. , vol.3 , Issue.4 , pp. 624-627
    • Leonard, J.A.1    Kramer, M.A.2    Ugar, L.H.3
  • 11
    • 0031094371 scopus 로고    scopus 로고
    • Linear circuit diagnosis using neuromorphic analyzers
    • Spina R., Upadhyaya S. Linear circuit diagnosis using neuromorphic analyzers. IEEE Trans. Circ. Syst.-II. 43:(3):1997;188-196.
    • (1997) IEEE Trans. Circ. Syst.-II , vol.43 , Issue.3 , pp. 188-196
    • Spina, R.1    Upadhyaya, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.