A knowledge-based approach for fault detection and isolation in analog circuits

IEEE International Conference on Neural Networks - Conference Proceedings

Volumn 3, Issue , 1997, Pages 1580-1584

  El Gamal, M A ^a,b  

^a UNITED ARAB EMIRATES UNIVERSITY   (United Arab Emirates)

^b CAIRO UNIVERSITY   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG FAULT DETECTIONS; CIRCUIT UNDER TEST; DOMAIN KNOWLEDGE; FAULT DETECTION AND ISOLATION; FAULT ISOLATION; KNOWLEDGE-BASED APPROACH; TESTING EXAMPLES; TRAINING SETS;

ELECTRIC FAULT CURRENTS; FAULT DETECTION; NEURAL NETWORKS; ERROR DETECTION; INTEGRATED CIRCUIT TESTING; KNOWLEDGE BASED SYSTEMS;

KNOWLEDGE BASED SYSTEMS; NEURAL NETWORKS;

KNOWLEDGE BASED ANALOG FAULT DETECTION;

EID: 0030653253     PISSN: 10987576     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICNN.1997.614129     Document Type: Conference Paper

References (12)

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