Deduction of the temperature-dependent structure of the four-layer intermediate smectic phase using resonant X-ray scattering

European Physical Journal E

Volumn 23, Issue 3, 2007, Pages 281-287

  Brimicombe, P D ^a   Roberts, N W ^a   Jaradat, S ^a   Southern, C ^a   Wang, S T ^b   Huang, C C ^b   Dimasi, E ^c   Pindak, R ^c   Gleeson, H F ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b University of Minnesota   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HELICOIDAL PITCH; RESONANT X-RAY SCATTERING;

ANTIFERROELECTRIC MATERIALS; RESONANCE; THERMAL EFFECTS; X RAY SCATTERING;

SMECTIC LIQUID CRYSTALS;

SELENIUM;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; DRUG MIXTURE; LIQUID CRYSTAL; METHODOLOGY; PHASE TRANSITION; TEMPERATURE; X RAY DIFFRACTION;

COMPLEX MIXTURES; COMPUTER SIMULATION; LIQUID CRYSTALS; MODELS, CHEMICAL; PHASE TRANSITION; SELENIUM; TEMPERATURE; X-RAY DIFFRACTION;

EID: 34547895557     PISSN: 12928941     EISSN: 1292895X     Source Type: Journal    
DOI: 10.1140/epje/i2007-10189-0     Document Type: Article

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